Closed loop controller and method for fast scanning probe microscopy
View Patent ↗A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor over the scan bandwidth. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.
1. A method of operating a metrology instrument, comprising:
generating relative motion between a probe and a sample at a scan frequency using an actuator exhibiting a non-linear response;
detecting motion of the actuator using a position sensor, wherein the position sensor exhibits noise in the detected motion;
controlling the XY position of the actuator with a control signal, u, using both a feedback loop and a feed forward algorithm, wherein a feedback signal, u fb , associated with the feedback loop is updated during operation of the metrology instrument by combining a signal associated with a predetermined path defined by the feed forward algorithm therewith, wherein the feed forward algorithm substantially continuously updates the control signal so that the XY motion of the actuator substantially follows a reference thereby compensating for the non-linear response;
wherein the controlling step includes operating the feedback loop at a bandwidth less than the scan frequency associated with the generating step thereby attenuating noise in the actuator position compared to the noise in the detected motion in the corresponding bandwidth; and
wherein the bandwidth of the feedback loop is different than a bandwidth associated with operation of the feedforward algorithm.
2. The method of claim 1 , wherein the feed forward algorithm includes using an inversion-based control algorithm.
3. The method of claim 2 , wherein the inversion-based control algorithm uses at least one transfer function associated with the actuator.
4. The method of claim 2 , wherein the inversion-based control algorithm adaptively produces a correction that contributes to a control signal that compensates for at least one of the non-linearities and the dynamics of the actuator.
5. The method of claim 4 , wherein the control signal produces a peak position error of less than about 1% of the total scan range after no more than about 10 iterations of 10 scan lines per iteration.
6. The method of claim 5 , wherein the control signal produces a peak position error of less than about 1% of the total scan range after no more than about 5 seconds.
7. The method of claim 1 , wherein the scan frequency is at least 1/100 th the fundamental resonant frequency of the actuator.
8. The method of claim 7 , wherein the scan frequency is at least ⅓ rd the fundamental resonant frequency of the actuator.
9. The method of claim 8 , wherein the resonant frequency of the actuator is greater than about 100 Hz and the scan frequency is at least about 10 Hz.
10. The method of claim 9 , wherein the scan frequency is at least about 100 Hz.
11. The method of claim 10 , wherein the scan frequency is at least about 300 Hz.
12. The method of claim 1 , wherein the bandwidth of the feedback loop is less than the scan frequency.
13. The method of claim 1 , wherein the bandwidth of the feedback loop is less than about 10 hz.
14. The method of claim 1 , wherein the controlling step attenuates the noise in the actuator position to less than about 1 Angstrom RMS within a noise bandwidth equal to about seven times the scan frequency.
15. The method of claim 14 , wherein the controlling step includes using a PI controller.
16. A method of operating a metrology instrument, comprising:
generating, with an actuator exhibiting a non-linear response, relative motion between a probe and a sample at a scan frequency over a scan size;
detecting motion of the actuator using a position sensor; and
controlling, with a feedback loop operating at a bandwidth less than the scan frequency associated with the generating step and a feed forward algorithm operating so as to reduce a threshold error corresponding to the detecting step by substantially continuously combining signals generated by the feedback loop and feedforward algorithm, the generating step to substantially follow a reference signal to achieve a position error of the relative XY motion compared to the reference signal that is less than about 1% of the scan size, thereby compensating for the non-linear response; and
wherein the bandwidth of the feedback loop is less than about 10 Hz, and the bandwidth of the feedforward algorithm is greater than about 300 Hz.
17. The method of claim 16 , wherein the feed forward algorithm is an adaptive feed forward algorithm that estimates a transfer function of the actuator in response to the position error and adjusts the generating step based at least in part on the transfer function.
18. The method of claim 17 , wherein the response of the actuator is dependent on an operating condition.
19. The method of claim 18 , wherein the operation condition is at least one of scan frequency, size, angle, and offset.
20. The method of claim 16 , wherein the scan frequency is greater than about 30 Hz.
21. The method of claim 20 , wherein the scan frequency is greater than about 100 Hz.
22. The method of claim 21 , wherein the scan frequency is greater than about 300 Hz.
23. The method of claim 16 , wherein the bandwidth of the feedback loop is less than the scan frequency.
24. The method of claim 16 , wherein the feed forward algorithm includes using an inversion-based control algorithm and iteratively produces a correction that contributes to a control signal that compensates for at least one of the non-linearities and the dynamics of the actuator.
25. The method of claim 24 , wherein the control signal produces a peak position error of less than about 1% of the total scan range after no more than about 5 seconds.
26. The method of claim 24 , wherein the correction is a waveform.
27. The method of claim 16 , wherein the position error is an integral position error.
28. A scanning probe microscope (SPM) comprising:
an actuator that generates relative motion between a probe and a sample at a scan frequency;
a sensor that detects motion of the actuator and generates noise;
a controller including a feedback loop that generates an XY position control signal, u, based on the detected motion; and
wherein a feedback signal, u fb , associated with the feedback loop is updated during operation of the metrology instrument by combining a signal associated with a predetermined path defined by a feed forward algorithm therewith, and the feed forward algorithm substantially continuously updates the control signal so that the motion of the actuator substantially follows a reference;
wherein the bandwidth of the feedback loop is less than the scan frequency thereby attenuating noise in the actuator position compared to the noise in the detected motion; and
wherein the bandwidth of the feedback loop is different than a bandwidth associated with operation of the feedforward algorithm.
29. The scanning probe microscope of claim 28 , wherein the feedback loop attenuates noise in the actuator position compared to noise exhibited by the sensor.
30. The scanning probe microscope of claim 29 , wherein the feed forward algorithm includes using an inversion-based control algorithm and iteratively produces a correction that contributes to a control signal that compensates for at least one of the non-linearities and the dynamics of the actuator.
31. The scanning probe microscope of claim 30 , wherein the correction is a scan table.
32. The scanning probe microscope of claim 28 , wherein the scan frequency is at least 1/100 th the fundamental resonant frequency of the actuator.
33. The scanning probe microscope of claim 32 , wherein the scan frequency is at least 1/10 th the fundamental resonant frequency of the actuator.
34. The scanning probe microscope of claim 33 , wherein the scan frequency is at least ⅓ rd the fundamental resonant frequency of the actuator.
35. The scanning probe microscope of claim 28 , wherein the scan frequency is greater than about 10 Hz.
36. A method of operating a metrology instrument, comprising:
generating relative motion between a probe and a sample at a scan frequency using an actuator exhibiting a non-linear response;
detecting motion of the actuator using a position sensor, wherein the position sensor exhibits noise in the detected motion;
controlling the XY position of the actuator with a control signal, u, using a feedback loop and an adaptive feed forward algorithm; and
wherein a feedback signal, u fb , associated with the feedback loop is updated during operation of the metrology instrument by combining a signal associated with a predetermined path defined by the feed forward algorithm therewith, and wherein the feed forward algorithm substantially continuously updates the control signal so that the motion of the actuator substantially follows a reference, wherein the adaptive feed forward algorithm repeatedly updates the generating step in response to the detected motion of the actuator, thereby compensating for the non-linear response;
wherein the bandwidth of the feedback loop is less than the scan frequency; and
wherein the bandwidth of the feedback loop is different than a bandwidth associated with operation of the feedforward algorithm.
37. The method of claim 36 , wherein the adaptive feed forward algorithm iteratively determines a correction to the generating step.
38. The method of claim 36 , wherein the generating step includes using a reference signal that is a triangle wave.
39. The method of claim 38 , further comprising reducing ripple in the triangle wave using a window.
40. The method of claim 16 , wherein the feed forward algorithm is employed only in a test scan to create a scan table that compensates for the position error, wherein the scan table is used when imaging a sample.
41. A method of operating a metrology instrument, comprising:
generating relative motion between a probe and a sample at a scan frequency using an actuator exhibiting a non-linear response;
detecting motion of the actuator using a position sensor, wherein the position sensor exhibits noise in the detected motion, and wherein the detected motion;
controlling the XY position of the actuator according to a reference with a control signal, u, simultaneously using both a feedback loop and a feed forward algorithm during image acquisition by substantially continuously combining signals generated by the feedback loop and the feedforward algorithm, wherein the feed forward algorithm allows the controlling step to control the actuator to follow the trajectory of desired scanning motion as represented by the reference, thereby compensating for the non-linear response;
wherein the bandwidth of the feedback loop is less than the scan frequency; and
wherein the bandwidth of the feedback loop is different than a bandwidth associated with operation of the feedforward algorithm.
42. The method of claim 1 , wherein the bandwidth of the feedback loop is at least a factor of three less than the scan frequency, and a bandwidth at which the feed forward algorithm is operated is at least one order of magnitude greater than the scan frequency.