Apparatus and method of transporting and loading probe devices of a metrology instrument
View Patent ↗The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
1. A probe cassette for one or more probe devices of a scanning probe microscope (SPM), the probe cassette comprising:
a base having at least one probe storage receptacle;
a lid mountable on the base so as to at least substantially cover the at least one receptacle;
a probe retainer that retains at least one of the SPM probe devices in the receptacle under a compressive force; and
wherein the compressive force is generated by deforming a compliant element; and
the compliant element is a spring.
2. A probe cassette for one or more probe devices of a scanning probe microscope (SPM), the probe cassette comprising:
a base having at least one probe storage receptacle;
a lid mountable on the base so as to at least substantially cover the at least one receptacle;
a probe retainer that retains at least one of the SPM probe devices in the receptacle under a compressive force; and
wherein the probe retainer is compliant so as to generate the compressive force.
3. A probe cassette for one or more probe devices of a scanning probe microscope (SPM), the probe cassette comprising:
a base having at least one probe storage receptacle;
a lid mountable on the base so as to at least substantially cover the at least one receptacle;
a probe retainer that retains at least one of the SPM probe devices in the receptacle under a compressive force;
wherein the compressive force is generated by deforming a compliant element; and
the compliant element is mounted on the lid independent of the probe retainer.
4. A probe cassette for one or more probe devices of a scanning probe microscope (SPM), the probe cassette comprising:
a base having at least one probe storage receptacle;
a lid mountable on the base so as to at least substantially cover the at least one receptacle;
a probe retainer that retains at least one of the SPM probe devices in the receptacle under a compressive force; and
wherein the compressive force is generated by deforming at least one of a) at least a portion of the lid and b) the probe retainer.
5. The probe cassette as recited in claim 4 , wherein the probe retainer includes a surface that contacts the probe device when the lid is coupled to the base and does not contact the probe device upon lid removal.
6. The probe cassette as recited in claim 5 , wherein at least the surface of the probe retainer that contacts the probe device is non-stick.
7. The probe cassette as recited in claim 6 , wherein the probe retainer has a surface energy less than about 30 ergs/cm 2 .
8. The probe cassette as recited in claim 6 , wherein the surface of the probe retainer is conductive and is formed using a polymer.
9. The probe cassette as recited in claim 8 , wherein the polymer is carbon impregnated PTFE.
10. The probe cassette as recited in claim 4 , wherein the base is directly mountable in the SPM such that the probe device can be automatically loaded onto a probe mount of the SPM.
11. The probe cassette as recited in claim 4 , wherein the probe cassette is pre-loaded with the one probe device so that when shipped, the probe device is automatically loadable onto a probe mount of the SPM.
12. The probe cassette of claim 4 , wherein the retainer is coupled to the lid with an adhesive.
13. The probe cassette of claim 4 , wherein an angle formed between the probe retainer and a surface of the lid is between about 30 degrees and 60 degrees.
14. The probe cassette of claim 4 , wherein the probe retainer extends toward the at least one probe device so that it interfaces with substantially only the substrate of the probe device.