Method and apparatus for manipulating a sample
View Patent ↗A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.
1. A method for operating a probe that interacts with a surface of a sample, comprising:
scanning a region the surface of the sample with the probe;
manipulating the surface of the sample with the probe;
selecting a subregion of the region; and
rescanning the selected subregion of the region of the surface of the sample.
2. The method for operating a probe that interacts with a surface of a sample according to claim 1 , wherein the manipulating step further comprises manipulating the surface of the sample with a probe other than the probe used to scan the region of the surface of the sample.
3. The method for operating a probe that interacts with a surface of a sample according to claim 1 , wherein the manipulating step further comprises manipulating the surface of the sample with the probe used to scan the region of the surface of the sample.
4. The method for operating a probe that interacts with a surface of a sample according to claim 3 , wherein
the manipulating step further comprises manipulating a subregion of the region of the surface of the sample with the probe, and
the rescanning step further comprises rescanning the manipulated subregion of the region of the surface of the sample.
5. The method for operating a probe that interacts with a surface of a sample according to claim 3 , wherein the manipulating step further comprises manipulating particles on the surface of the sample with the probe.
6. The method for operating a probe that interacts with a surface of a sample according to claim 3 , wherein the manipulating step further comprises manipulating particles on the surface of the sample by picking up the particles with the probe.
7. The method for operating a probe that interacts with a surface of a sample according to claim 1 , wherein the probe comprises:
a cantilever;
a first tip mounted on the cantilever; and
a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging tip.
8. The method for operating a probe that interacts with a surface of a sample according to claim 7 , further comprising applying a voltage across the first tip and the second tip to combine the first tip and the second tip to form an imaging tip.
9. A method for operating a probe that interacts with a surface of a sample, comprising:
scanning a region of the surface of the sample with the probe;
manipulating the sample with the probe;
rescanning a subregion of the region of the surface of the sample; and
applying a voltage across the first tip and the second tip to combine the first tip and the second tip to form an imaging probe, wherein the probe comprises:
a cantilever;
a first tip mounted on a cantilever; and
a second tip mounted on the cantilever, the first and the second tips being configured to combine to form an imaging probe.