Dynamic activation for an atomic force microscope and method of use thereof
View Patent ↗A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.
1. An AFM for analyzing a surface of a sample, the AFM comprising:
a cantilever having a tip;
an oscillator that oscillates said cantilever; and
an amplitude detection circuit that actively modifies the quality factor (Q) associated with the cantilever in the amplitude domain and in response to a deflection signal to actively modify the bandwidth of amplitude detection of the AFM.
2. The AFM according to claim 1 , wherein said amplitude detection circuit generates an error signal based on said deflection signal.
3. The AFM according to claim 2 , wherein the amplitude detection circuit includes a gain stage that applies a gain to the error signal to generate a modified deflection signal.
4. The AFM according to claim 3 , wherein said oscillator generates an oscillating drive signal, and said amplitude detection circuit modulates the oscillating drive signal based on the modified deflection signal.
5. The AFM according to claim 1 , further comprising a band-pass filter to filter an output of the amplitude detection circuit.
6. The AFM according to claim 1 , wherein said oscillator includes a piezoelectric element.
7. The AFM according to claim 6 , wherein said-cantilever supports said piezoelectric element.
8. The AFM according to claim 1 , wherein the cantilever is a passive cantilever.
9. The AFM according to claim 1 , wherein said amplitude detection circuit is implemented with a gain and offset topology.
10. An AFM for analyzing a surface of a sample in cyclical mode, the AFM comprising:
a z-actuator;
a cantilever having a tip for scanning the surface;
an active driving circuit that includes an oscillator coupled to the cantilever to oscillate said cantilever;
a deflection detection circuit that generates a deflection signal in response to deflection of the cantilever; and
wherein said active driving circuit includes an amplitude detection circuit that actively modifies the quality factor (Q) associated with said cantilever in response to the deflection signal to actively modify the bandwidth of amplitude detection of the AFM in the amplitude domain.
11. The AFM according to claim 10 , wherein said amplitude detection circuit generates an error signal based on said deflection signal.
12. The AFM according to claim 11 , wherein the amplitude detection circuit includes a gain stage that applies a gain to the error signal to generate a modified deflection signal.
13. The AFM according to claim 12 , wherein said oscillator generates an oscillating drive signal, and said amplitude detection circuit modulates the oscillating drive signal based on the modified deflection signal.
14. The AFM according to claim 10 , further comprising a band-pass filter to filter an output of the active driving circuit.