IP Library Assignment 024672/0350
Patent Assignment
Reel/Frame 024672/0350

Merger

Recorded: 2010-07-13 Pages: 5
Assignor
VEECO METROLOGY, LLC
Executed: 2006-04-30
Assignee
VEECO METROLOGY INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties (17)
Scanning Probe Microscope
Patent: 5,376,790 →
Application: 07/850,669 →
Optical System for Scanning Microscope
Patent: 5,448,399 →
Application: 07/850,677 →
Piezpresistive Cantilever for Scanning Probe Microscope
Patent: 5,444,244 →
Application: 08/073,201 →
Scanning Probe Microscope
Patent: 5,496,999 →
Application: 08/320,490 →
Scanning Force Microscope Having Aligning and Adjusting Means
Patent: 35,514 →
Application: 08/325,997 →
Large Stage System for Scanning Probe Microscopes and Other Instruments
Patent: 5,672,816 →
Application: 08/448,004 →
Single Axis Vibration Reducing System
Patent: 5,811,821 →
Application: 08/694,690 →
Scanning Probe Microscope Providing Unobstructed Top Down and Bottom Up Views
Patent: 5,854,487 →
Application: 08/808,351 →
Scanning Probe Microscope with Multimode Head
Patent: 6,130,427 →
Application: 08/828,771 →
Scanning Probe Microscope with Scan Correction
Patent: 5,939,719 →
Application: 08/831,153 →
Atomic Force Microscope for Attachment to Optical Microscope
Patent: 5,861,624 →
Application: 08/916,571 →
Atomic Force Microscope with Integrated Optics for Attachment to Optical Microscope
Patent: 5,952,657 →
Application: 08/916,830 →
Voice Coil Scanner for Use in Scanning Probe Microscope
Patent: 6,005,251 →
Application: 09/119,808 →
Kinematically Mounted Probe Holder for Scanning Probe Microscope
Patent: 6,057,546 →
Application: 09/129,066 →
Scanning Probe Microscope with Scan Correction
Patent: 6,057,547 →
Application: 09/208,733 →
Scanning probe microscope with scan correction
Patent: 6,265,718 →
Application: 09/561,448 →
Optical System for Scanning Microscope
Patent: 6,590,703 →
Application: 09/906,985 →
Publication: US 2001/0054691
Related Assignments (6)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name Jul 13, 2010
From: THERMOMICROSCOPES CORP.
To: TM MICROSCOPES CORP.
Reel/Frame 024672/0330 →
Change of Name Jul 13, 2010
From: PARK SCIENTIC INSTRUMENTS CORPORATION
To: THERMOMICROSCOPES CORP.
Reel/Frame 024672/0335 →
Merger Jul 13, 2010
From: TM MICROSCOPES CORP.
To: VEECO METROLOGY, LLC
Reel/Frame 024672/0340 →
Release of Security Interest Jul 15, 2010
From: SILICON VALLEY BANK
To: VEECO INSTRUMENTS INC.
Reel/Frame 024686/0135 →
Change of Name Oct 24, 2011
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 027111/0461 →
Change of Name Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 028350/0511 →