Patent Assignment
Reel/Frame 024953/0612
Change of Name
Recorded: 2010-09-09
Pages: 4
Assignor
VEECO TUCSON INC.
Executed: 2006-04-07
Assignee
VEECO METROLOGY INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(27)
Apparatus and Method for Automatically Focusing an Interference Microscope
Patent:
5,122,648 →
Application:
07/531,884 →
Apparatus and Method for Simultaneous Measurement of Film Thickness and Surface Height Variation for Film-Substrate Sample
Patent:
5,129,724 →
Application:
07/647,555 →
Method for Rapid, Accurate Measurement of Step Heights Between Dissimilar Materials
Patent:
5,173,746 →
Application:
07/703,457 →
Rough Surface Profiler and Method
Patent:
5,133,601 →
Application:
07/714,215 →
Optical Position Sensor for Scanning Probe Microscopes
Patent:
5,172,002 →
Application:
07/748,460 →
Interferometric Integration Technique and Apparatus to Confine 2PI Discontinuity
Patent:
5,321,497 →
Application:
07/848,309 →
Rough Surface Profiler and Method
Patent:
5,204,734 →
Application:
07/880,083 →
Scanning Probe Microscope Including Height Plus Deflection Method and Apparatus to Achieve Both High Resolution and High Speed Scanning
Patent:
5,260,572 →
Application:
07/929,676 →
Method for Testing an Optical Window with a Small Wedge Angle
Patent:
5,398,112 →
Application:
08/131,486 →
Rough Surface Profiler and Method
Patent:
5,355,221 →
Application:
08/143,372 →
Multimode-Laser Interferometric Apparatus for Eliminating Background Interference Fringes from Thin-Plate Measurements
Patent:
5,452,088 →
Application:
08/210,671 →
Combination of Motorized and Piezoelectric Translation for Long-Range Vertical Scanning Interferometry
Patent:
5,446,547 →
Application:
08/235,105 →
Combination of White-Light Scanning and Phase-Shifting Interferometry for Surface Profile Measurements
Patent:
5,471,303 →
Application:
08/247,065 →
Method and Apparatus for Restoring Digitized Video Pictures Generated by an Optical Surface-Height Profiler
Patent:
5,717,782 →
Application:
08/339,405 →
Method and Apparatus for Absolute Optical Measurement of Entire Surfaces of Flats
Patent:
5,502,566 →
Application:
08/387,635 →
Centroid Approach for Estimating Modulation Peak in Broad-Bandwidth Interferometry
Patent:
5,633,715 →
Application:
08/446,019 →
Method for Measuring Thin-Film Thickness and Step Height on the Surface of Thin-Film/Substrate Test Samples by Phase-Shifting Interferometry
Patent:
5,555,471 →
Application:
08/449,353 →
Method and Apparatus for Correcting Surface Profiles Determined by Phase-Shifting Interferometry According to Optical Parameters of Test Surface
Patent:
5,602,643 →
Application:
08/597,796 →
Orthogonal-Scanning Microscope Objective for Vertical-Scanning and Phase-Shifting Interferometry
Patent:
5,640,270 →
Application:
08/613,462 →
Variable-Speed Scanning for Interferometric Measurements
Patent:
5,726,754 →
Application:
08/697,865 →
Method of Combining Multiple Sets of Overlapping Surface-Profile Interferometric Data to Produce a Continuous Composite Map
Patent:
5,987,189 →
Application:
08/771,428 →
Method and Apparatus for Correcting Shifts Between a Reference Focal Point and a Reference Surface as a Result of Thermal Effects in an Interferometric Optical Objective
Patent:
5,978,086 →
Application:
08/814,351 →
Interchangeable Sample Stage with Integral Reference Surface for Magnetic-Head Suspension Measuring Instrument
Patent:
5,844,675 →
Application:
08/866,747 →
Autocollimator with Grating
Patent:
5,995,215 →
Application:
08/889,675 →
High Speed Autofocus and Tilt for an Optical Imaging System
Patent:
6,677,565 →
Application:
09/135,734 →
Method of Combining Multiple Sets of Overlapping Surface-Profile Interferometric Data to Produce a Continuous Composite Map
Patent:
6,185,315 →
Application:
09/153,365 →
Vertical Probe Card for Attachment Within a Central Corridor of a Magnetic Field Generator
Patent:
6,359,453 →
Application:
09/255,477 →
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 30, 1996
From: ANDREWS, MICHAEL P.; UNRUH, PAUL R
To: WYKO CORPORATION
Reel/Frame 008142/0215 →
Merger
Sep 9, 2003
From: OPTIMAG INC
To: WYKO CORPORATION
Reel/Frame 014464/0412 →
Change of Name
Sep 9, 2003
From: WYKO CORPORATION
To: VEECO TUCSON INC.
Reel/Frame 014464/0428 →
Assignment of Assignor's Interest
Sep 9, 2003
From: WAHL, MICHAEL H.; WOMACK, KENNETH H.; ROBERTS, PHILIP G.
To: OPTIMAG, INC.
Reel/Frame 014495/0713 →
Change of Name
Sep 7, 2010
From: WYKO CORPORATION
To: VEECO TUCSON INC.
Reel/Frame 024946/0669 →
Change of Name
Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 028350/0511 →
Change of Name
Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO INC.
Reel/Frame 028350/0420 →