Patent Assignment
Reel/Frame 028350/0420
Change of Name
Recorded: 2012-06-11
Pages: 7
Assignor
VEECO METROLOGY INC.
Executed: 2010-10-07
Assignee
BRUKER NANO INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(31)
Folded Low-Power Interference Microscope Objective
Patent:
5,907,400 →
Application:
08/946,303 →
Selection Process for Sequentially Combining Multiple Sets of Overlapping Surface-Profile Interferometric Data to Produce a Continuous Composite Map
Patent:
5,991,461 →
Application:
08/992,310 →
System for Eliminating Scattered Light in Autocollimator for Magnetic-Head Suspension Measuring Instrument
Patent:
5,929,987 →
Application:
09/121,765 →
High Speed Autofocus and Tilt for an Optical Imaging System
Patent:
6,677,565 →
Application:
09/135,734 →
Disk-Mount Device for Automatic Successive Testing of Computer-Drive Disk Blanks by Interferometry
Patent:
6,188,485 →
Application:
09/291,521 →
Embedded Interferometer for Reference-Mirror Calibration of Interferometric Microscope
Patent:
6,545,761 →
Application:
09/452,334 →
Automated Minimization of Optical Path Difference and Reference Mirror Focus in White-Light Interference Microscope Objective
Patent:
6,552,806 →
Application:
09/497,567 →
Pulsed Source Scanning Interferometer
Patent:
6,556,305 →
Application:
09/505,500 →
Lateral-Scanning Interferometric with Tilted Optical Axis
Patent:
6,449,048 →
Application:
09/569,131 →
Alignment of Magnetic Heads for Automatic Identification of Regions of Interest for Interferometric Measurement
Patent:
6,459,489 →
Application:
09/585,370 →
Self-centering crash protection mechanism for interference microscope objective
Patent:
6,266,183 →
Application:
09/664,141 →
Reduced Noise Sensitivity Method and Apparatus for Converting an Interferogram Phase Map to a Surface Profile Map
Patent:
6,738,511 →
Application:
09/679,277 →
Bat-Wing Attenuation in White-Light Interferometry
Correction of Scanning Errors in Interferometric Profiling
Patent:
6,624,893 →
Application:
09/875,638 →
Scanning Interferometry with Reference Signal
Reference Signal for Stitching of Interferometric Profiles
Patent:
6,987,570 →
Application:
10/109,361 →
Alignment and Correction Template for Optical Profilometric Measurement
Microscope with Fixed-Element Autocollimator for Tilt Adjustment
Measurement of Object Deformation with Optical Profiler
Film Thickness and Boundary Characterization by Interferometric Profilometry
Profilometry Through Dispersive Medium Using Collimated Light with Compensating Optics
Mounting Mechanism for Compensating Optics in Interferometer
Measurement of Thin Films Using Fourier Amplitude
High-Definition Vertical-Scan Interferometry
Patent:
7,605,925 →
Application:
11/473,447 →
Solid-State Imaging Device, Method of Driving Solid-State Imaging Device, and Camera
Variable-Wavelength Illumination System for Interferometry
Interferometric Measurement of Non-Homogeneous Multi-Material Surfaces
Interferometric Iterative Technique with Bandwidth and Numerical-Aperture Dependency
Interferometric Measurement of Dlc Layer on Magnetic Head
Real-Time Scanner-Nonlinearity Error Correction for Hdvsi
Patent:
7,898,672 →
Application:
12/082,846 →
Real-Time Effective-Wavelength Error Correction for Hdvsi
Patent:
7,956,630 →
Application:
12/766,744 →
Related Assignments
(13)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 9, 2003
From: WAHL, MICHAEL H.; WOMACK, KENNETH H.; ROBERTS, PHILIP G.
To: OPTIMAG, INC.
Reel/Frame 014495/0713 →
Change of Name
Sep 9, 2003
From: WYKO CORPORATION
To: VEECO TUCSON INC.
Reel/Frame 014464/0428 →
Merger
Sep 9, 2003
From: OPTIMAG INC
To: WYKO CORPORATION
Reel/Frame 014464/0412 →
Assignment of Assignor's Interest
Jan 16, 2004
From: SCHMIT, JOANNA; UNRUH, PAUL R.; NOVAK, ERIK L.
To: VEECO INSTRUMENTS, INC.
Reel/Frame 014919/0706 →
Assignment of Assignor's Interest
Jun 16, 2004
From: UNRUH, PAUL R.; SCHMIT, JOANNA; NOVAK, ERIK L.
To: VEECO INSTRUMENTS, INC.
Reel/Frame 015472/0620 →
Assignment of Assignor's Interest
Dec 3, 2004
From: HAN, SEN; NOVAK, ERIK L.
To: VEECO INSTRUMENTS, INC.
Reel/Frame 016053/0690 →
Assignment of Assignor's Interest
Apr 29, 2005
From: GUENTHER, BRYAN W.; NOVAK, ERIK L.
To: VEECO INSTRUMENTS INC.
Reel/Frame 015963/0159 →
Change of Name
Sep 9, 2010
From: VEECO TUCSON INC.
To: VEECO METROLOGY INC.
Reel/Frame 024953/0612 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded on Reel 009341 Frame 0592. Assignor(S) Hereby Confirms the Assignee's Name Should Be Veeco Instruments Inc. Instead of Veeco Corporation.
Sep 14, 2010
From: HAYES, JOHN B.
To: VEECO INSTRUMENTS INC.
Reel/Frame 024990/0225 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded on Reel 008765 Frame 0224. Assignor(S) Hereby Confirms the Assignee's Name Should Be Veeco Instruments Inc. Instead of Veeco Corporation.
Sep 14, 2010
From: AZIZ, DAVID J.
To: VEECO INSTRUMENTS INC.
Reel/Frame 024982/0390 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded on Reel 009006 Frame 0697. Assignor(S) Hereby Confirms the Assignee's Name Should Be Veeco Instruments Inc. Instead of Veeco Corporation.
Sep 14, 2010
From: SCHUMUCKER, MARK A.; SCHMIT, JOANNA
To: VEECO INSTRUMENTS INC.
Reel/Frame 024982/0372 →
Corrective Assignment to Correct the Assignee's Name Previously Recorded on Reel 009903 Frame 0042. Assignor(S) Hereby Confirms the Assignee's Name Should Be Veeco Instruments Inc. Instead of Veeco Corporation.
Sep 14, 2010
From: STUMPE, KENNETH
To: VEECO INSTRUMENTS INC.
Reel/Frame 024982/0355 →
Assignment of Assignor's Interest
Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →