IP Library Assignment 015472/0620
Patent Assignment
Reel/Frame 015472/0620

Assignment of Assignor's Interest

Recorded: 2004-06-16 Pages: 5
Assignors
UNRUH, PAUL R.
Executed: 2004-05-19
SCHMIT, JOANNA
Executed: 2004-05-19
NOVAK, ERIK L.
Executed: 2004-06-03
Assignee
VEECO INSTRUMENTS, INC.
2650 E. ELVIRA ROAD, TUCSON, ARIZONA, 85706
Covered Property (1)
Film Thickness and Boundary Characterization by Interferometric Profilometry
Patent: 7,119,909 →
Application: 10/869,138 →
Publication: US 2005/0280829
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Change of Name Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO INC.
Reel/Frame 028350/0420 →