Patent Assignment
Reel/Frame 024933/0710
Change of Name
Recorded: 2010-09-03
Pages: 5
Assignor
THERMOMICROSCOPES CORP.
Executed: 2001-07-16
Assignee
TM MICROSCOPES CORP.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(7)
Scanning Force Microscope Having Aligning and Adjusting Means
Patent:
5,157,251 →
Application:
07/668,886 →
Atomic Force Microscope Having Cantilever with Piezoresistive Deflection Sensor
Patent:
5,345,815 →
Application:
07/954,695 →
Atomic Force Microscope Having Cantilever with Piezoresistive Deflection Sensor
Patent:
5,483,822 →
Application:
08/238,546 →
Method of Fabricating Cantilever for Atomic Force Microscope Having Piezoresistive Deflection Detector
Patent:
5,595,942 →
Application:
08/417,485 →
Scanning Apparatus Linearization and Calibration System
Patent:
5,641,897 →
Application:
08/560,827 →
Resonance Contact Scanning Force Microscope
Patent:
5,681,987 →
Application:
08/631,555 →
Scanning Probe Microscope Having a Single Viewing Device for on-Axis and Oblique Angle Views
Patent:
5,714,756 →
Application:
08/710,239 →
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 1, 2010
From: TOPOMETRIX CORPORATION
To: PARK SCIENTIFIC INSTRUMENTS CORPORATION
Reel/Frame 024915/0754 →
Change of Name
Sep 2, 2010
From: PARK SCIENTIFIC INSTRUMENTS CORPORATION
To: THERMOMICROSCOPES CORP.
Reel/Frame 024933/0059 →
Merger
Sep 7, 2010
From: TM MICROSCOPES CORP.
To: VEECO METROLOGY, LLC
Reel/Frame 024933/0984 →
Merger
Sep 8, 2010
From: VEECO METROLOGY, LLC
To: VEECO METROLOGY INC.
Reel/Frame 024953/0435 →
Change of Name
Oct 24, 2011
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 027111/0461 →
Change of Name
Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 028350/0511 →