IP Library Assignment 019645/0027
Patent Assignment
Reel/Frame 019645/0027

Assignment of Assignor's Interest

Recorded: 2007-07-27 Pages: 3
Assignor
SASAYAMA, NORIO
Executed: 2007-07-09
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Fluorescent X-Ray Analysis Apparatus
Patent: 7,471,763 →
Application: 11/805,664 →
Publication: US 2007/0280414
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →