Patent Assignment
Reel/Frame 019688/0122
Assignment of Assignor's Interest
Recorded: 2007-08-14
Pages: 2
Assignor
SAKAMOTO, HIDEO
Executed: 2007-08-07
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Device and Method of Measuring Sheet Resisitance of Lower Layer Conductive Pattern Thereof
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.