IP Library › Assignment 019708/0092
Patent Assignment
Reel/Frame 019708/0092

Assignment of Assignor's Interest

Recorded: 2007-08-03 Pages: 2
Assignors
SHOJO, TOMOYASU
Executed: 2007-07-27
FUKUDA, MUNEYUKI
Executed: 2007-08-02
SUZUKI, NAOMASA
Executed: 2007-07-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus, Scanning Electron Microscope, and Sample Observation Method Using the Same
Patent: 7,557,347 →
Application: 11/882,701 →
Publication: US 2008/0121803
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →