IP Library Assignment 019738/0086
Patent Assignment
Reel/Frame 019738/0086

Assignment of Assignor's Interest

Recorded: 2007-08-10 Pages: 3
Assignors
KOYAMA, SHIN
Executed: 2007-08-01
TOGO, MITSUHIRO
Executed: 2007-08-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Pattern for evaluating electric characteristics, method for evaluating electric characteristics, method for manufacturing semiconductor device and method for providing reliability assurance
Application: 11/889,267 →
Publication: US 2008/0038851
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 2, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025235/0233 →