IP Library › Assignment 019751/0334
Patent Assignment
Reel/Frame 019751/0334

Assignment of Assignor's Interest

Recorded: 2007-08-28 Pages: 5
Assignors
LIM, VICTOR SENG KEONG
Executed: 2007-08-27
LAM, JEFFREY
Executed: 2007-08-27
Assignee
CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
60 WOODLANDS INDUSTRIAL PARK D STREET 2, SINGAPORE, 738406, SINGAPORE
Covered Property (1)
E-Beam Inspection Structure for Leakage Analysis
Patent: 7,939,348 →
Application: 11/845,787 →
Publication: US 2009/0057664