Patent Assignment
Reel/Frame 019780/0376
Assignment of Assignor's Interest
Recorded: 2007-08-31
Pages: 2
Assignee
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM, (IMEC), VZW
75 KAPELDREEF, LEUVEN, B-3001, BELGIUM
Covered Property
(1)
Method and Device for the Independent Extraction of Carrier Concentration Level and Electrical Junction Depth in a Semiconductor Substrate
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.