IP Library › Assignment 019882/0274
Patent Assignment
Reel/Frame 019882/0274

Assignment of Assignor's Interest

Recorded: 2007-09-21 Pages: 2
Assignors
TANAKA, HIROYUKI
Executed: 2002-12-12
SEKIYAMA, AKINORI
Executed: 2002-12-12
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8588, JAPAN
Covered Property (1)
Semiconductor Device, Semiconductor Package, and Method for Testing Semiconductor Device
Patent: 8,080,873 →
Application: 11/124,262 →
Publication: US 2005/0200005
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 11, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021977/0219 →
Assignment of Assignor's Interest Jan 9, 2009
From: TANAKA, HIROYUKI; ITO, YOSHITO; SEKIYAMA, AKINORI
To: FUJITSU LIMITED
Reel/Frame 022088/0556 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024748/0328 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →