Patent Assignment
Reel/Frame 022088/0556
Assignment of Assignor's Interest
Recorded: 2009-01-09
Pages: 7
Assignors
TANAKA, HIROYUKI
Executed: 2002-12-12
ITO, YOSHITO
Executed: 2002-12-12
SEKIYAMA, AKINORI
Executed: 2002-12-12
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8588, JAPAN
Covered Property
(1)
Semiconductor Device, Semiconductor Package, and Method for Testing Semiconductor Device
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 21, 2007
From: TANAKA, HIROYUKI; SEKIYAMA, AKINORI
To: FUJITSU LIMITED
Reel/Frame 019882/0274 →
Assignment of Assignor's Interest
Dec 11, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021977/0219 →
Change of Name
Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024748/0328 →
Assignment of Assignor's Interest
Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →