IP Library › Assignment 019895/0258
Patent Assignment
Reel/Frame 019895/0258

Assignment of Assignor's Interest

Recorded: 2007-09-28 Pages: 3
Assignors
URANO, YUTA
Executed: 2007-06-28
HAMAMATSU, AKIRA
Executed: 2007-07-04
MAEDA, SHUNJI
Executed: 2007-07-04
SAKAI, KAORU
Executed: 2007-07-05
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI, 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Apparatus
Patent: 7,664,608 →
Application: 11/776,572 →
Publication: US 2008/0015802
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →