Patent Assignment
Reel/Frame 019971/0515
Assignment of Assignor's Interest
Recorded: 2007-10-03
Pages: 3
Assignors
KOBAYASHI, SUSUMU
Executed: 2007-09-21
HIRATA, MORIHISA
Executed: 2007-09-21
OKUSHIMA, MOTOTSUGU
Executed: 2007-09-21
KITAYAMA, TOMOHIRO
Executed: 2007-09-21
KATOU, TETSUYA
Executed: 2007-09-21
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Esd Analysis Device and Esd Analysis Program Used for Designing Semiconductor Device and Method of Designing Semiconductor Device
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.