Patent Assignment
Reel/Frame 019979/0944
Assignment of Assignor's Interest
Recorded: 2007-10-18
Pages: 4
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Scanning Probe Microscope Displacement Detecting Mechanism and Scanning Probe Microscope Using Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.