IP Library Assignment 019987/0043
Patent Assignment
Reel/Frame 019987/0043

Assignment of Assignor's Interest

Recorded: 2007-10-19 Pages: 2
Assignor
NAOE, MITSUFUMI
Executed: 2007-08-02
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8588, JAPAN
Covered Property (1)
Exposure Mask, Manufacturing Method of Electronic Device, and Checking Method of Exposure Mask
Patent: 7,855,035 →
Application: 11/874,431 →
Publication: US 2008/0096113
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
Change of Name Sep 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025046/0478 →
Change of Address Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →