Patent Assignment
Reel/Frame 021976/0089
Assignment of Assignor's Interest
Recorded: 2008-12-09
Received: 2008-12-09
Pages: 57
Assignor
FUJITSU LIMITED
Executed: 2008-11-04
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU, TOKYO, JPX, 163-0722, JAPAN
Covered Properties
(100)
Method of making a semiconductor device with residual amine group free multilayer interconnection
Application:
12/289,227 →
Semiconductor Device, Dram Integrated Circuit Device, and Method of Producing the Same
Application:
12/285,848 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/285,748 →
Selective Epitaxial Growth Method Using Halogen Containing Gate Sidewall Mask
Application:
12/285,723 →
Semiconductor Integrated Circuit Device and Method of Producing the Same
Application:
12/285,289 →
Semiconductor device and method for fabricating the same
Application:
12/285,274 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/285,275 →
Semiconductor Device Having Capacitor with Capacitor Film Held Between Lower Electrode and Upper Electrode
Application:
12/240,140 →
Manufacturing Method of Semiconductor Device
Application:
12/240,005 →
Misfet, Semiconductor Device Having the Misfet and Method of Manufacturing the Same
Application:
12/238,799 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/239,332 →
Semiconductor Device Using Metal Nitride as Insulating Film and Its Manufacture Method
Application:
12/232,944 →
Semiconductor Device Suitable for a Stacked Structure
Application:
12/210,645 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/205,495 →
Semiconductor Device Fabricated by Selective Epitaxial Growth Method
Application:
12/230,373 →
Semiconductor Device and Plural Semiconductor Elements with Suppressed Bending
Application:
12/195,653 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/187,851 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/187,050 →
Semiconductor Device with Strain
Application:
12/219,882 →
Ferroelectric Memory Device, Ferroelectric Memory Manufacturing Method, and Semiconductor Manufacturing Method
Application:
12/177,621 →
Semiconductor Device and Process for Manufacturing the Same
Application:
12/177,602 →
P-Channel Mos Transistor and Semiconductor Integrated Circuit Device
Application:
12/176,616 →
Method of Manufacturing Semiconductor Device
Application:
12/219,271 →
Semiconductor Device, Semiconductor Wafer Structure and Method for Manufacturing the Semiconductor Wafer Structure
Application:
12/175,039 →
Semiconductor Device and Its Manufacturing Method
Application:
12/219,019 →
Semiconductor Device and Method of Manufacturing Semiconductor Device
Application:
12/171,676 →
Method of Manufacturing Semiconductor Device Suitable for Forming Wiring Using Damascene Method
Application:
12/216,832 →
Fabrication of Semiconductor Device Having Low Leakage and High Performance Transistors
Application:
12/169,719 →
Method for Manufacturing Semiconductor Device
Application:
12/167,293 →
Method of Manufacturing Semiconductor Device
Application:
12/216,273 →
Semiconductor Device and a Fabrication Process Thereof
Application:
12/216,134 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/147,899 →
Semiconductor Device and Adjusting Method for Semiconductor Device
Application:
12/163,193 →
Semiconductor Device with Pads of Enhanced Moisture Blocking Ability
Application:
12/163,418 →
Semiconductor Device with Improved Pads
Application:
12/163,340 →
Semiconductor Device and Manufacturing Method of the Same
Application:
12/213,819 →
Semiconductor device and fabrication process thereof
Application:
12/213,759 →
Method of Manufacturing a Semiconductor Device
Application:
12/140,508 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/139,720 →
Semiconductor Device and Manufacturing Method of the Semiconductor Device
Application:
12/136,955 →
Wafer-Level Package Having Test Terminal
Application:
12/155,783 →
Semiconductor Device with Strengthened Pads
Application:
12/134,625 →
Semiconductor Wafer Storage Case and Semiconductor Wafer Storing Method
Application:
12/131,296 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/131,288 →
Semiconductor Device with Ferro-Electric Capacitor
Application:
12/128,088 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/127,902 →
Simulation Method and Computer-Readable Storage Medium Storing Program for Causing Computer to Analyze Circuit Operation Using Cell Characteristics Affected by Environment
Application:
12/126,063 →
Semiconductor Device and Fabrication Process Thereof
Application:
12/126,357 →
Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device
Application:
12/153,481 →
Semiconductor Device Fabrication Method, Semiconductor Device, and Semiconductor Layer Formation Method
Application:
12/120,576 →
Method of Manufacturing Semiconductor Device
Application:
12/118,245 →
Semiconductor Device, Leadframe and Structure for Mounting Semiconductor Device
Application:
12/112,428 →
Method for Manufacturing Semiconductor Device
Application:
12/149,320 →
Semiconductor Device and Manufacturing Method Thereof
Application:
12/111,379 →
Simulation Method and Computer-Readable Storage Medium
Application:
12/111,470 →
Method of Manufacturing a Semiconductor Device and Semiconductor Device
Application:
12/110,662 →
Method of Semiconductor Device Protection, Package of Semiconductor Device
Application:
12/081,961 →
Semiconductor Device and Manufacturing Method Thereof
Application:
12/081,723 →
Ic Socket with Attached Electronic Component
Application:
12/104,038 →
Substrate Structure and Manufacturing Method of the Same
Application:
12/098,724 →
Semiconductor Device and Manufacturing Method Thereof
Application:
12/098,710 →
Ferroelectric Memory Device and Fabrication Process Thereof, Fabrication Process of a Semiconductor Device
Application:
12/061,408 →
Semiconductor Device and Method of Manufacturing a Semiconductor Device
Application:
12/061,367 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/059,754 →
Method of Manufacturing a Semiconductor Device, Pattern Correction Apparatus, and Computer-Readable Recording Medium
Application:
12/059,895 →
Polishing Method, Polishing Apparatus, and Method for Manufacturing Semiconductor Device
Application:
12/055,753 →
Semiconductor Device, Method of Manufacturing Thereof and Mask for Dividing Exposure
Application:
12/055,542 →
Semiconductor Variable Capacitor and Method of Manufacturing the Same
Application:
12/055,747 →
Semiconductor Device Including a P-Channel Type Mos Transistor
Application:
12/055,708 →
Method of Manufacturing a Semiconductor Device and a Semiconductor Device
Application:
12/054,684 →
Signal Transmission Circuit for Increasing Soft Error Tolerance
Application:
12/053,886 →
Semiconductor Device and Manufacturing Method Thereof
Application:
12/053,926 →
Semiconductor Device, Moisture-Resistant Frame, Groove and Method of Producing Semiconductor Device
Application:
12/053,903 →
Method of Manufacturing Semiconductor Device Which a Plurality of Types of Transistors Are Mounted
Application:
12/053,089 →
Method of Correcting a Mask Pattern and Method of Manufacturing a Semiconductor Device
Application:
12/052,965 →
Method of Manufacturing a Semiconductor Device Having Transistors and Semiconductor Device Having Transistors
Application:
12/052,216 →
Surface Modifying Carbon Nanotube Material, Manufacturing Method Therefor, Electronic Component and Electronic Device
Application:
12/052,265 →
Method of Forming a Gate Layer with Multiple Ecthing Steps
Application:
12/052,195 →
Method of Manufacturing a Semiconductor Device and a Semiconductor Manufacturing Equipment
Application:
12/052,288 →
Method of Manufacturing a Semiconductor Device
Application:
12/051,193 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/049,592 →
Resin Sealing Method, Mold for Resin Sealing, and Resin Sealing Apparatus
Application:
12/049,616 →
Semiconductor Device Having a High Frequency Electrode Positioned with a via Hole
Application:
12/076,033 →
Wiring Board for Flip-Chip Mounting, Mounting Structure of Electronic Components on Wiring Board, and Semiconductor Device Including Wiring Board
Application:
12/047,811 →
Wiring Substrate and Electronic Device
Application:
12/046,893 →
Pattern Transfer Mask, Focus Variation Measuring Method and Apparatus, and Semiconductor Device Manufacturing Method
Application:
12/043,197 →
Method of Manufacturing a Semiconductor Device
Application:
12/043,551 →
Computer Aided Design Apparatus, Computer Aided Design Program, Computer Aided Design Method for a Semiconductor Device and Method of Manufacturing a Semiconductor Circuit Based on Characteristic Value and Simulation Parameter
Application:
12/042,059 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/042,025 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/041,274 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/040,393 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/040,426 →
Substrate Structure and Manufacturing Method of the Same
Application:
12/040,044 →
Semiconductor Device and Method for Manufacturing the Same
Application:
12/039,149 →
Photodiode, Solid State Image Sensor, and Method of Manufacturing the Same
Application:
12/037,438 →
Ferroelectric Memory Device and Fabrication Process Thereof, Fabrication Process of a Semiconductor Device
Application:
12/037,286 →
Stacked semiconductor chips having double adhesive insulating layer interposed therebetween
Application:
12/071,628 →
Semiconductor Device and Method of Producing the Same
Application:
12/036,844 →
Carrier Tape, Electronic-Component Accommodating Member and Method of Transporting Electronic Component
Application:
12/036,742 →
Substrate Processing Apparatus, Substrate Processing Method, and Method of Manufacturing Semiconductor Device
Application:
12/034,975 →