IP Library Granted Patent US 8,198,728
Granted Patent B2
US 8,198,728 · App. 12/195,653 · Granted Jun 12, 2012

Semiconductor device and plural semiconductor elements with suppressed bending

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,198,728
App. No.
12/195,653
Granted
Jun 12, 2012
Kind
B2
Abstract

A semiconductor device includes a supporting base whereupon an electrode terminal is placed; an intermediate member mounted on said supporting base; a semiconductor element, a portion thereof being supported with said intermediate member, and placed on said supporting base; and a convex-shaped member which corresponds to the electrode terminal of said semiconductor element and placed on said supporting base or said intermediate member; wherein the electrode terminal of said semiconductor element and the electrode terminal of said supporting base are connected with a bonding wire.

Claims (17)

1. A semiconductor device comprising:

a supporting base whereupon a first electrode terminal and a first conductive pattern are placed;

an intermediate member mounted on the supporting base;

a semiconductor element, a portion thereof being supported with the intermediate member, and placed over the supporting base, the semiconductor element having an extension part from an end of the intermediate member, the extension part having a second electrode terminal and a second conductive pattern on one surface and having an adhesive layer on the other surface; and

a convex-shaped member made from a metal bump and placed on the first conductive pattern;

wherein the adhesive layer and the supporting base face each other, the convex-shaped member is between the first conductive pattern and the adhesive layer, a gap being defined between the convex-shaped member and the adhesive layer, and the first electrode terminal and the second electrode terminal are connected with a bonding wire.

2. The semiconductor device according to claim 1 , wherein the intermediate member is another semiconductor element or a spacer member.

3. The semiconductor device according to claim 1 , wherein the convex-shaped member is a metal bump and is formed with a ball bonding method.

4. The semiconductor device according to claim 2 , wherein the convex-shaped member is a metal bump and is formed with a ball bonding method.

5. A semiconductor device comprising:

a supporting base whereupon a first electrode terminal and a first conductive pattern are placed;

a first semiconductor element mounted on the supporting base;

a second semiconductor element, a portion thereof being supported with the first semiconductor element, and placed over the supporting base, the second semiconductor element having an extension part from an end of the first semiconductor element, the extension part having a second electrode terminal and a second conductive pattern on one surface and having an adhesive layer on the other surface; and

a convex-shaped member made from a metal bump and placed on the first conductive pattern;

wherein the adhesive layer and the supporting base face each other, the convex-shaped member is between the first conductive pattern and the adhesive layer, a gap being defined between the convex-shaped member and the adhesive layer, and the first electrode terminal and the second electrode terminal are connected with a bonding wire.

6. The semiconductor device according to claim 5 , wherein the convex-shaped member is a metal bump and is formed with a ball bonding method.

7. The semiconductor device according to claim 5 , wherein the second semiconductor element extends from the first semiconductor element to the supporting base in cantilever form.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0637 →
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 22, 2008
From: NISHIMURA, TAKAO
To: FUJITSU LIMITED
Reel/Frame 021429/0223 →