Patent Assignment
Reel/Frame 020030/0405
Assignment of Assignor's Interest
Recorded: 2007-10-29
Pages: 2
Assignor
NISHIKAWA, RYOTA
Executed: 2007-04-19
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Method and device of generating test circuit for semiconductor device
Application:
11/797,545 →
Publication:
US 2007/0274142
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.