Patent Assignment
Reel/Frame 020068/0059
Assignment of Assignor's Interest
Recorded: 2007-11-05
Pages: 4
Assignors
IKKU, YUTAKA
Executed: 2007-09-18
ASAHATA, TATSUYA
Executed: 2007-09-18
SUZUKI, HIDEKAZU
Executed: 2007-09-12
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method and Apparatus of Measuring Thin Film Sample and Method and Apparatus of Fabricating Thin Film Sample
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.