IP Library › Assignment 020073/0771
Patent Assignment
Reel/Frame 020073/0771

Assignment of Assignor's Interest

Recorded: 2007-10-26 Pages: 3
Assignors
NAKAGAWA, HIROSHI
Executed: 2007-10-09
OISHI, KANJI
Executed: 2007-10-09
Assignee
ELPIDA MEMORY, INC.
2-1, YAWSU 2-CHOME, CHUO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Memory Device and Method of Testing Same
Patent: 7,913,126 →
Application: 11/976,652 →
Publication: US 2008/0101142
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Assignment of Assignor's Interest May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032899/0588 →
Change of Name Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
Assignment of Assignor's Interest Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046867/0248 →