IP Library Assignment 020084/0180
Patent Assignment
Reel/Frame 020084/0180

Assignment of Assignor's Interest

Recorded: 2007-11-08 Pages: 3
Assignors
FUKUDA, MUNEYUKI
Executed: 2007-09-13
SHOJO, TOMOYASU
Executed: 2007-09-13
SATO, MITSUGU
Executed: 2007-10-09
FUKADA, ATSUKO
Executed: 2007-10-15
SUZUKI, NAOMASA
Executed: 2007-09-21
TACHIBANA, ICHIRO
Executed: 2007-10-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electron Beam Apparatus and Electron Beam Inspection Method
Patent: 7,875,849 →
Application: 11/877,715 →
Publication: US 2008/0099673
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →