Patent Assignment
Reel/Frame 020109/0851
Assignment of Assignor's Interest
Recorded: 2007-10-30
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Electron Microscope and a Method for Pattern Composite Inspection Using the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.