IP Library › Assignment 020126/0520
Patent Assignment
Reel/Frame 020126/0520

Assignment of Assignor's Interest

Recorded: 2007-11-16 Pages: 3
Assignors
USUI, SATOSHI
Executed: 2007-09-19
HASHIMOTO, KOJI
Executed: 2007-09-19
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property (1)
Calibration Method, Inspection Method, and Semiconductor Device Manufacturing Method
Patent: 7,978,902 →
Application: 11/898,323 →
Publication: US 2008/0063255
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →