Patent Assignment
Reel/Frame 020215/0912
Assignment of Assignor's Interest
Recorded: 2007-11-27
Pages: 3
Assignor
AKIYAMA, NAOTO
Executed: 2007-10-30
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Method of Testing Semiconductor Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.