Patent Assignment
Reel/Frame 020269/0217
Assignment of Assignor's Interest
Recorded: 2007-12-17
Pages: 2
Assignor
KOZAKAI, TOMOKAZU
Executed: 2007-11-20
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Working Method by Focused Ion Beam and Focused Ion Beam Working Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.