Patent Assignment
Reel/Frame 020357/0621
Assignment of Assignor's Interest
Recorded: 2008-01-14
Pages: 2
Assignor
NAKADAIRA, MASAO
Executed: 2008-01-07
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Device, and Test Circuit and Test Method for Testing Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.