Assignment of Assignor's Interest

Recorded: 2008-01-15 Pages: 2

Assignor

TAKU, KAZUHIRO

Executed: 2008-01-07

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Test Pattern Generating Device and Test Pattern Generating Method

Application: 12/014,119 →

Publication: US 2008/0222473

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.