Patent Assignment
Reel/Frame 020404/0850
Assignment of Assignor's Interest
Recorded: 2008-01-15
Pages: 3
Assignor
LEE, JONG-HYUN
Executed: 2007-07-19
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Defect Analysis Methods for Semiconductor Integrated Circuit Devices and Defect Analysis Systems