Patent Assignment
Reel/Frame 020413/0169
Assignment of Assignor's Interest
Recorded: 2008-01-14
Pages: 3
Assignors
KANG, MOON-SHIK
Executed: 2008-01-03
KIM, JONG-AN
Executed: 2008-01-03
LEE, MYUNG-SUB
Executed: 2008-01-03
YANG, YU-SIN
Executed: 2008-01-03
KIM, JI-HYE
Executed: 2008-01-03
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Detecting Defects in a Substrate Having a Semiconductor Device Thereon