Patent Assignment
Reel/Frame 020424/0232
Assignment of Assignor's Interest
Recorded: 2008-01-28
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPOARATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspecting Device for Sample Surface and Defect Detection Method Therefor
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.