Patent Assignment
Reel/Frame 020461/0647
Assignment of Assignor's Interest
Recorded: 2008-01-23
Pages: 4
Assignor
NAKAMURA, HISASHI
Executed: 2007-12-17
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Test pattern generation circuit having plural pseudo random number generation circuits supplied with clock signals at different timing respectively
Application:
12/010,264 →
Publication:
US 2008/0178055
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.