Patent Assignment
Reel/Frame 020527/0499
Assignment of Assignor's Interest
Recorded: 2008-02-19
Pages: 2
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Semiconductor testing equipment and semiconductor testing method
Application:
11/878,466 →
Publication:
US 2008/0094096
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.