Patent Application
Utility
App. No. 11/878,466
· Confirmation No. 8165
Semiconductor testing equipment and semiconductor testing method
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2009-12-28 | ABN |
Abandonment | 2 | View | |
| 2009-05-26 | CTFR |
Final Rejection | 11 | View | |
| 2009-05-26 | 892 |
List of references cited by examiner | 1 | View | |
| 2009-05-26 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2009-05-26 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2009-05-26 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2009-05-05 | STATUS.LET |
Request for status of Application | 1 | View | |
| 2009-02-05 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2009-02-05 | CLM |
Claims | 11 | View | |
| 2009-02-05 | REM |
Applicant Arguments/Remarks Made in an Amendment | 3 | View | |
| 2009-02-05 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2008-11-07 | CTNF |
Non-Final Rejection | 9 | View | |
| 2008-11-07 | 892 |
List of references cited by examiner | 1 | View | |
| 2008-11-07 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2008-11-07 | 1449 |
List of References cited by applicant and considered by examiner | 2 | View | |
| 2008-11-07 | SRNT |
Examiner's search strategy and results | 3 | View | |
| 2008-11-07 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2008-04-24 | NTC.PUB |
Notice of Publication | 1 | View | |
| 2007-08-16 | APP.FILE.REC |
Filing Receipt | 3 | View | |
| 2007-07-24 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2007-07-24 | FOR |
Foreign Reference | 5 | View | |
| 2007-07-24 | FOR |
Foreign Reference | 17 | View | |
| 2007-07-24 | FRPR |
Certified Copy of Foreign Priority Application | 34 | View | |
| 2007-07-24 | FRPR |
Certified Copy of Foreign Priority Application | 25 | View | |
| 2007-07-24 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2007-07-24 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2007-07-24 | TRNA |
Transmittal of New Application | 3 | View | |
| 2007-07-24 | ADS |
Application Data Sheet | 4 | View | |
| 2007-07-24 | SPEC |
Specification | 32 | View | |
| 2007-07-24 | CLM |
Claims | 7 | View | |
| 2007-07-24 | ABST |
Abstract | 1 | View | |
| 2007-07-24 | DRW |
Drawings-only black and white line drawings | 10 | View | |
| 2007-07-24 | OATH |
Oath or Declaration filed | 2 | View | |
| 2007-07-24 | 136A |
Authorization for Extension of Time all replies | 3 | View |
Inventors
Satoshi Kishimoto
Osaka, JAPAN
Tomohiko Kanemitsu
Osaka, JAPAN
Attorneys & Agents of Record
Classification
USPC
324/765
G01R31/2894
G01R31/31721
Prosecution
- Examiner
- CHAN, EMILY Y
- Art Unit
- 2829
- Customer No.
- 53067
- Docket No.
- 28951.5579
- Confirmation No.
- 8165
Foreign Priority
2006-285603
·
2006-10-20
·
JAPAN
2007-117817
·
2007-04-27
·
JAPAN
Publication
- Pub. No.
- US20080094096A1
- Pub. Date
- 2008-04-24
No related applications found.
CHANGE OF NAME
Recorded 2008-11-20
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2008-02-19
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Quick Facts
- App. No.
- 11/878,466
- Filed
- 2007-07-24
- Pub. No.
- US20080094096A1
- Examiner
- CHAN, EMILY Y
- Art Unit
- 2829
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