Patent Assignment
Reel/Frame 020646/0704
Assignment of Assignor's Interest
Recorded: 2008-03-13
Pages: 5
Assignors
WASHIO, KENICHI
Executed: 2008-02-18
YASUTA, KATSUO
Executed: 2008-02-21
SUGIYAMA, UMENORI
Executed: 2008-02-21
Assignee
KABUSHIKI KAISHA NIHON MICRONICS
6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI, TOKYO 180-0004, JAPAN
Covered Property
(1)
Method for Testing a Semiconductor Wafer and Apparatus Thereof