Patent Assignment
Reel/Frame 020671/0329
Assignment of Assignor's Interest
Recorded: 2008-03-19
Pages: 2
Assignors
ONO, MAKOTO
Executed: 2008-02-21
KONISHI, JUNKO
Executed: 2008-02-21
FUNAKOSHI, TOMOHIRO
Executed: 2008-02-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Analyzing Apparatus, Program, Defect Inspection Apparatus, Defect Review Apparatus, Analysis System, and Analysis Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.