Patent Assignment
Reel/Frame 020673/0144
Assignment of Assignor's Interest
Recorded: 2008-03-19
Pages: 3
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU,, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Scanning Probe Microscope and Scanning Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.