Patent Assignment
Reel/Frame 020777/0729
Assignment of Assignor's Interest
Recorded: 2008-04-07
Pages: 4
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
KUBACHER WEG 4, WEILBURG, 35781, GERMANY
Covered Property
(1)
Method for Acquiring High-Resolution Images of Defects on the Upper Surface of the Wafer Edge
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.