Patent Assignment
Reel/Frame 020892/0220
Assignment of Assignor's Interest
Recorded: 2008-04-23
Pages: 4
Assignor
MIKAMI, KIYOSHI
Executed: 2008-04-17
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Scan Test Circuit and Scan Test Control Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.