Patent Assignment
Reel/Frame 025235/0497
Change of Name
Recorded: 2010-11-02
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Retainer Ring and Polishing Machine
Semiconductor Inspection Apparatus
Floating Gate Memory Device with Improved Reference Current Generation
Semiconductor Device
Semiconductor Manufacturing Apparatus and Manufacturing Method of Semiconductor Device
Light Receiving Circuit
Pipeline Type Analog-Digital Converter Having Redundant Comparator
Semiconductor Device Having Elongated Electrostatic Protection Element Along Long Side of Semiconductor Chip
Semiconductor Device Including a Coupling Region Which Includes Layers of Aluminum and Copper Alloys
Semiconductor Device Having Stress Alleviating Portion Positioned at Outer Circumference of Chip, Wiring Substrate, and Method for Producing the Same
Application:
12/068,438 →
Publication:
US 2008/0203564
Self-Refresh Control Circuit for Detecting Current Flowing from Current Generator and Semiconductor Device Including Same
Method and Program for Designing Semiconductor Device
Semiconductor device including copper wiring and via wiring having length longer than width thereof and method of manufacturing the same
Application:
12/068,712 →
Publication:
US 2008/0197494
Semiconductor Device Having Transistors Each Having Gate Electrode of Different Metal Ratio and Production Process Thereof
Phase Locked Loop Circuit Including Digital Voltage-Controlled Oscillator, Ring Oscillator and Selector
Semiconductor Device, Method and Apparatus for Testing Same, and Method for Manufacturing Semiconductor Device
Method of Manufacturing Semiconductor Device Using Electrochemical Deposition with Electric Current Revised by Reflectance of Every Substrate Surface and Semiconductor Manufacturing Apparatus
Focus Detecting Device
Semiconductor Package Land Grid Array Substrate and Plurality of First and Second Electrodes
Voltage Boosting Power Supply Circuit for Monitoring Charging Voltage with Predetermined Voltage to Detect Boosted Voltage, and Boosted Voltage Control Method
Intermittent Driving System
Semiconductor Device
Semiconductor Device
Analog-To-Digital Converting Circuit
Array-type processor having delay adjusting circuit for adjusting a clock cycle in accordance with a critical path delay of the data path
Driver circuit of display unit separating amplifier and output terminal in response to test signal and method of controlling the same
Application:
12/071,763 →
Publication:
US 2008/0238905
Voltage Generator for Nonvolatile Memory and Writing and Erasing Method of Nonvolatile Memory
Semiconductor Circuit Including Electrostatic Discharge Circuit Having Protection Element and Trigger Transistor
Data Line Driver Circuit for Display Panel and Method of Testing the Same
Input Signal Detecting Circuit
Dither Circuit and Analog Digital Converter Having Dither Circuit
Method of Manufacturing Semiconductor Device and Control System
Method of Manufacturing Semiconductor Device
Clock Generator Circuit, Clock Selector Circuit, and Semiconductor Integrated Circuit
Master-slave type flip-flop circuit and latch circuit
Application:
12/073,334 →
Publication:
US 2008/0218233
Semiconductor device
Application:
12/073,488 →
Publication:
US 2008/0188048
I/O Interface Circuit of Intergrated Circuit
Semiconductor Device Having Projection on Lower Electrode and Method for Forming the Same
Semiconductor Device Having Differential Signal Detection Circuit for Entry into Mode Other Than Normal Operation
Semiconductor Laser Element and Method for Producing Same
Semiconductor Memory Apparatus
On-Chip Debug Emulator, Debugging Method, and Microcomputer
Semiconductor Device Including Mounting Board with Stitches and First and Second Semiconductor Chips
Semiconductor Device Having an Esd Protection Circuit
Semiconductor Device
Overcurrent Detecting Circuit and Semiconductor Device
Semiconductor Integrated Circuit with Multi-Cut via and Automated Layout Method for the Same
Manufacturing Method for Semiconductor Device
Test Circuit, Pattern Generating Apparatus, and Pattern Generating Method
Voltage Controlled Oscillator
Cache control method, cache device, and microcomputer
Application:
12/076,784 →
Publication:
US 2008/0250211
Multiprocessor System for Restricting an Access Request to a Shared Resource
Jitter Detection Circuit and Jitter Detection Method
Interface Circuit
Method of Manufacturing a Semiconductor Memory Device Having a Floating Gate
Receiving Apparatus and Signal Processing Method
Layout verification program, layout data and cell data
Application:
12/078,613 →
Publication:
US 2008/0263484
Microcomputer and Method of Setting Operation of Microcomputer
Communication adapter and data transfer method of communication adapter
Application:
12/078,728 →
Publication:
US 2008/0250173
Data Development Device and Data Development Method
Semiconductor Device Including Power Switch and Power Reinforcement Cell
Probe Resistance Measurement Method and Semiconductor Device with Pads for Probe Resistance Measurement
Clock and Data Recovery Circuit
Driver of display unit
Displacement Detection Pattern for Detecting Displacement Between Wiring and via Plug, Displacement Detection Method, and Semiconductor Device
Semiconductor Device and Method for Manufacturing the Same
Electrostatic Protection Circuit
Semiconductor Memory Device and Method of Testing Same
Through-current power table, method of generating thereof and method of calculating power consumption
Application:
12/081,057 →
Publication:
US 2008/0270089
Semiconductor Circuit
Semiconductor Circuit
Apparatus and method for performing motion compensation by macro block unit while decoding compressed motion picture
Application:
12/081,090 →
Publication:
US 2008/0259089
Image Processing Apparatus for Reading Compressed Data from and Writing to Memory via Data Bus and Image Processing Method
Variable Gain Circuit
Clock and Data Recovery Circuit
Semiconductor Device Including Capacitor Including Upper Electrode Covered with High Density Insulation Film and Production Method Thereof
Method for Fabricating an Electronic Device Substrate
Semiconductor Integrated Circuit and Method of Testing Same
Semiconductor Device Controlling Debug Operation of Processing Unit in Response to Permission or Prohibition from Other Processing Unit
Inverter Apparatus and a Semiconductor Device Used for the Same
Digital-To-Analog Converter Circuit Including Adder Drive Circuit and Display
Scan Test Circuit and Scan Test Control Method
Semiconductor device including barrier metal and coating film and method for manufacturing same
Application:
12/081,930 →
Publication:
US 2008/0290523
Semiconductor Device Having Vertical Mosfet
Current Detection Circuit
Semiconductor Device and Method of Manufacturing Semiconductor Device
Semiconductor Memory Device, Method of Driving the Same and Method of Manufacturing the Same
Method of Manufacturing a Semiconductor Device
Semiconductor Device and Method of Manufacturing Same
Dot Clock Generating Circuit, Semiconductor Device, and Dot Clock Generating Method
Application:
12/100,145 →
Publication:
US 2008/0278465
Semiconductor Device and Dummy Pattern Arrangement Method
Sample Wafer Fabrication Method
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 1, 2008
From: YOSHIKAWA, KEI; SHIBATA, RYUSUKE; SAWATAISHI, TOKIO; NAGANO, NOBUO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020516/0058 →
Assignment of Assignor's Interest
Feb 4, 2008
From: KOBAYASHI, NOBUYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020514/0134 →
Assignment of Assignor's Interest
Feb 4, 2008
From: TANAKA, TAKEKAZU; TAKAHASHI, KOUHEI; OKABE, SEIJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020514/0261 →
Assignment of Assignor's Interest
Feb 4, 2008
From: MATSUBAYASHI, TOMOYA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020516/0224 →
Assignment of Assignor's Interest
Feb 6, 2008
From: MOTOYOSHI, SOUICHIROU; HONDA, HIROKAZU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020534/0140 →
Assignment of Assignor's Interest
Feb 6, 2008
From: KOGA, HIROKI; TANIGUCHI, KAZUTAKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020531/0575 →
Assignment of Assignor's Interest
Feb 8, 2008
From: NONAKA, MAKOTO; TERAYAMA, TOSHIAKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020534/0123 →
Assignment of Assignor's Interest
Feb 11, 2008
From: MATSUKI, TAKEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020545/0773 →
Assignment of Assignor's Interest
Feb 11, 2008
From: MATSUBARA, YOSHIHISA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020545/0722 →
Assignment of Assignor's Interest
Feb 12, 2008
From: SANO, MASAKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020560/0875 →
Assignment of Assignor's Interest
Feb 12, 2008
From: FURUYA, AKIRA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020561/0155 →
Assignment of Assignor's Interest
Feb 21, 2008
From: KIKUCHI, TETSUO; TAMIYA, KOSEI; TSUNAI, SHIRO
To: OLYMPUS IMAGING CORP.; OLYMPUS CORPORATION; NEC ELECTRONICS CORPORATION
Reel/Frame 020596/0635 →
Assignment of Assignor's Interest
Mar 24, 2008
From: NAKAMURA, YASUHIKO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020689/0203 →
Assignment of Assignor's Interest
Mar 25, 2008
From: KAMAHORI, HIDEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020696/0236 →
Assignment of Assignor's Interest
Mar 26, 2008
From: YAMADA, JUNICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020700/0515 →
Assignment of Assignor's Interest
Apr 2, 2008
From: BITO, YASUNORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020743/0069 →
Assignment of Assignor's Interest
Apr 4, 2008
From: TAKEHARA, KEIICHIROU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 020757/0470 →
Merger
Aug 5, 2015
From: OLYMPUS IMAGING CORP.
To: OLYMPUS CORPORATION
Reel/Frame 036279/0239 →
Change of Address
Jun 27, 2016
From: OLYMPUS CORPORATION
To: OLYMPUS CORPORATION
Reel/Frame 039344/0502 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →