IP Library › Assignment 020898/0140
Patent Assignment
Reel/Frame 020898/0140

Assignment of Assignor's Interest

Recorded: 2008-05-05 Pages: 3
Assignors
SHICHI, HIROYASU
Executed: 2008-03-31
TOMIMATSU, SATOSHI
Executed: 2008-03-31
UMEMURA, KAORU
Executed: 2008-03-28
KANEOKA, NORIYUKI
Executed: 2008-03-28
ISHIGURO, KOJI
Executed: 2008-03-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Ion Source, Ion Beam Processing/Observation Apparatus, Charged Particle Beam Apparatus, and Method for Observing Cross Section of Sample
Patent: 8,481,980 →
Application: 12/108,037 →
Publication: US 2009/0230299
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →