IP Library › Assignment 020913/0121
Patent Assignment
Reel/Frame 020913/0121

Assignment of Assignor's Interest

Recorded: 2008-05-07 Pages: 2
Assignors
TANAKA, MAKI
Executed: 2008-01-16
SHISHIDO, CHIE
Executed: 2008-01-16
NAGATOMO, WATARU
Executed: 2008-01-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Measuring Pattern Dimensions
Patent: 7,633,061 →
Application: 12/034,696 →
Publication: US 2008/0197280
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →