IP Library Assignment 020917/0765
Patent Assignment
Reel/Frame 020917/0765

Assignment of Assignor's Interest

Recorded: 2008-05-08 Pages: 2
Assignor
HONDA, TOSHIFUMI
Executed: 2008-02-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Defect Review Method and Device for Semiconductor Device
Patent: 7,626,163 →
Application: 12/033,470 →
Publication: US 2008/0290274
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →