IP Library Assignment 020953/0498
Patent Assignment
Reel/Frame 020953/0498

Assignment of Assignor's Interest

Recorded: 2008-05-15 Pages: 2
Assignors
NAKAGAWA, SHUICHI
Executed: 2008-02-18
TAKAMI, SHO
Executed: 2008-02-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Measuring Method and Electron Microscope
Patent: 7,795,581 →
Application: 12/038,116 →
Publication: US 2008/0210865
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →