IP Library › Assignment 021007/0071
Patent Assignment
Reel/Frame 021007/0071

Assignment of Assignor's Interest

Recorded: 2008-05-16 Pages: 2
Assignors
HARADA, MINORU
Executed: 2008-04-21
NAKAGAKI, RYO
Executed: 2008-04-21
OBARA, KENJI
Executed: 2008-04-22
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI, MINATO-KU, TOKYO 105-8717, JAPAN
Covered Property (1)
Method and System for Observing a Specimen Using a Scanning Electron Microscope
Patent: 7,932,493 →
Application: 12/153,333 →
Publication: US 2009/0084953
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →